Get An Introduction to Mixed-Signal IC Test and Measurement PDF

By Gordon Roberts, Friedrich Taenzler, Mark Burns

ISBN-10: 0199796211

ISBN-13: 9780199796212

With the proliferation of advanced semiconductor units containing electronic, analog, mixed-signal, and radio-frequency circuits, latest engineer needs to be fluent in all 4 circuit varieties. Written for complicated undergraduate and graduate-level scholars, in addition to engineering execs, An Introduction to Mixed-Signal IC attempt and Measurement, moment variation, encompasses analog, mixed-signal and radio-frequency circuits checks, with many appropriate business examples. The textual content assumes an outstanding historical past in analog and electronic circuits and a operating wisdom of desktops and machine programming.

An creation to Mixed-Signal IC try and Measurement, moment variation, comprises examples and illustrations--featuring cutting-edge business technology--to improve and brighten up the textual content. The booklet additionally introduces large-scale mixed-signal circuit and person circuit checks, discusses the value-added advantages of mixed-signal IC checking out to a manufacturer's product, and obviously defines the position of the try engineer.

New to This Edition
* a brand new bankruptcy on RF try out tools and basics of RF Testing
* a brand new bankruptcy on Clock and Serial information Communications Channel Measurements
* assurance of RF load board design
* New assurance of probabilistic reasoning for mixed-signal trying out

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Extra resources for An Introduction to Mixed-Signal IC Test and Measurement

Sample text

However, we can set the tester to expect valid logic levels during the appropriate digital vectors without specifying whether the ADC should produce a HI or a LO. While the pin card tests for valid logic levels, the samples from the ADC are collected into the digital capture memory for later analysis. In addition to the drive and compare circuits, digital pin cards may also include dynamic load circuits. 6. The diode bridge forces a programmable current into the DUT output whenever its voltage is below a programmable threshold voltage, VTH.

This allows subnanosecond accuracy in the placement of driven edges and in the placement of compare times (called strobes and windows). Strobe comparisons are performed at a particular point in time, while window comparisons are performed throughout a period of time. Window timing is typically used when comparing DUT outputs against expected patterns, while strobe timing is typically used when collecting data into capture memory. Again, this depends on the specific tester. 8 shows examples of several different formatting and timing combinations that create many different waveforms from the same digital data stream.

This test cost includes tester depreciation, handler depreciation, electricity, floor space, personnel, and so on. 5 s, assuming that 5 million devices per year are to be shipped. 5 s. 19. , for each $1 worth of devices shipped to the customer, the company makes a profit of 20 cents). 18? 80, how many devices does this represent? What obvious conclusion can we draw about the importance of test time reduction versus the importance of selling and shipping additional devices? 17 18 AN INTRODUCTION TO MIXED-SIGNAL IC TEST AND MEASUREMENT REFERENCES 1.

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An Introduction to Mixed-Signal IC Test and Measurement by Gordon Roberts, Friedrich Taenzler, Mark Burns

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